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http://www.eetchina.com/ART_8800401772_617693_2c787bd1.HTM作者: Carter 时间: 2006-1-9 15:13
NI, LEGO cooperate for robotics tools
Posted: 09 Jan 2006
National Instruments (NI) and the LEGO Group announced their collaborative development of the software component to the next generation of LEGO MINDSTORMS robotics. LEGO MINDSTORMS NXT includes an all-new programming environment, which is based on the NI LabVIEW graphical development software, and is PC and Mac compatible. The product, announced at the Consumer Electronics Tradeshow in Las Vegas, will be available in August 2006.
According to the press release, LEGO is taking advantage of technologies such as a 32bit processor, new motors and sensors, Bluetooth wireless communication and enhanced software development tools. The new software is touted to have an intuitive yet feature-rich programming environment allowing for click-and-drag icon-based programming. It is also said that younger users will find it much easier to create their own programs, while older users will appreciate the ability to create sophisticated programs for their robots. The new software will be used in both the retail and educational versions of LEGO MINDSTORMS NXT.
LEGO and NI have a long-standing relationship that began in 1998 with the development of RoboLab, the programming software used in the LEGO MINDSTORMS for Schools product.
"To broaden the base of MINDSTORMS users among younger children and more advanced robotics designers, it is important to get the product design right, but also to provide unlimited potential through the software tool," said Soren Lund, director of LEGO MINDSTORMS. "Using the sophisticated NI LabVIEW engine allows us to maintain everything users appreciate about the current MINDSTORMS experience, but then go the extra mile to provide a tool that is easy enough for a 10-year-old to master on a surface level and technical enough for an adult user to be challenged and inspired to create."
This article was printed from EE Times - Asia located at:
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作者: Carter 时间: 2006-1-11 13:17
Designing an Automated RF Test System for Flexible Data Mining and Reporting with NI LabVIEW and DIAdem
Author(s):
James West, Summitek Instruments
This article was from NI website - located at: http://sine.ni.com/csol/cds/item/vw/p/id/659/nid/124400
The Challenge:
Creating an automated RF test solution for improved analysis and reporting of historical test data.
The Solution:
Automating S-parameter measurement and developing a Web interface for comprehensive testing and report generation using National Instruments LabVIEW and DIAdem.
S-parameters, which help characterize the performance of passive and active devices, can be viewed in a variety of formats to provide unique insight into the characteristics of a device under test.
Two different customers challenged Summitek Instruments to create an Automated RF test system that automates S-parameter testing and improves their ability to analyze and retrieve data. One customer needed a better way to find historical test data and reproduce results, while the other wanted a more effective method for finding and analyzing test data for statistical process control (SPC).
Searching for a Better Method of Analyzing and Retrieving Test Data
Each customer already had a process for performing S-parameter measurements but no way to effectively access the data. We knew developing a proficient system would encompass:
Identifying a test data storage method that does not require a customized file format for each customer
Designing a test system that customers can adapt to fit their test processes
Providing tools to easily mine and analyze test data
Producing high-quality reports that customers can distribute as data sheets
Making the test system accessible to basic and advanced users
The first problem we solved was finding a generic test data storage methodology. We needed a solution that could store S-parameter test data and custom user fields, as well as offer the tools necessary to access the test data. For this, we used the data storage VIs in LabVIEW. The data storage VIs provided a way to store S-parameter test data as well as custom information related to each test and product.
The data storage VIs use XML-based technology to build an information hierarchy, which stores file, group, and channel information in .TDM files. We mapped the hierarchy so that files correspond to the products under test, groups correspond to each test run of a product, and channels correspond to each measurement.
We asked the customer to customize fields to associate with each test run (group). These customized fields are stored as properties of the test run. With the data storage VIs, we could store different data for each test run and each product tested. We also could store custom fields with the test data without a custom test data file format.
In addition, we wanted to provide a user interface that would be familiar to customers and give them the ability to release ongoing improvements to the product. We chose to use a server-based product strategy, which presented some not-so-obvious advantages such as the ability for customers to install their products on one computer and obtain access from multiple client locations. For example, test engineers in the United States can configure test sequences and access test data from a server in China. Another benefit to this approach is that customers can install improvements to the software on the server and make them immediately available to multiple test stations.
Our Spartan product uses an NI LabVIEW remote panel-based solution, and the Web interface we developed helps our customers configure and run tests as well as generate reports from a Web browser. Customers define which custom fields to use along with the S-parameter test sequences for each test run. Additionally, the Spartan collects the custom fields from the production technician and stores them and the test data on the Spartan server in .TDM data files. Company employees are able to generate test reports from any location with access to the Spartan server.
A database on the server combined with the .TDM data files provides an integrated solution that fulfills all of our requirements. Customers can store test parameters and the test data index in the Spartan database and the test data in the .TDM data files. Customers are able to search for data using standard fields such as product model number, serial number, or production technician name, and can data mine custom fields such as customer purchase order number or work orders. We created a simple query tool that constructs an SQL query for the test data index. The query results in a list of test data files that fit the criteria. As a result, customers are able to retrieve lists of products grouped by test station and perform SPC more efficiently.
We used NI DIAdem to load .TDM test data and report templates. Because DIAdem naturally incorporates the ability to access .TDM data files, it facilitates quick development of report-generation capabilities. With the rich features of DIAdem, customers can produce professional reports, including PDF reports, without extensive custom software.
A solution based on DIAdem offers other benefits. Advanced users can access the .TDM data files and create custom reports and custom analysis to fit their special needs. A complex data-mining tool in DIAdem offers additional capabilities beyond the scope of our test system. And, by using DIAdem in the Spartan product, we can accommodate basic and advanced users.
Savings Achieved with Spartan
Using data mining within Spartan, one customer was able to find and reproduce test data reports immediately, whereas the customer previously spent hours searching through boxes looking for printed test results. The customer was able to save on labor costs and shift the technicians to production.
We cut development time for our report-generation capability significantly and realized a dramatic savings from concept to report as compared to prior projects with report-generation capability. Elimination of custom file format definitions for each customer saves development time, so we can concentrate on adding features to the product.
For more information, contact:
James West
Senior Software Engineer, Summitek Instruments
12503 E. Euclid Driver #10
Englewood, CO 80111
Tel: (303) 768-8080
E-mail: jwest@Summitekinstruments.com
作者: Carter 时间: 2006-1-14 15:58
This article was printed from EE Times
NI certifies more than 250 Alliance Partners Posted: 13 Jan 2006
National Instruments (NI) recently announced that more than 250 of its current NI Alliance Partners have achieved NI developer certification in LabVIEW, LabWindows/CVI, NI TestStand or certification of products in applicable areas. These certified Alliance Partners provide integration and consulting services or offer products, such as sensors, cameras or instrument drivers, that NI has certified as compatible with its software and hardware.
NI also recognized 16 out of the more than 500 companies in the Alliance Partner program as Select Alliance Partners for 2006. Select Alliance Partners use their application expertise and in-depth knowledge of NI products to build customer-defined solutions in a wide range of industries and applications, including aerospace/defense, automotive and manufacturing test.
The NI Alliance Partner program includes business relationships between NI and more than 500 consultants, system integrators and developers worldwide. The program combines the wide variety of NI measurement and automation products with the specific industry expertise of consultants and systems integrators.
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