希望大家能积极参加这个讨论，如果有做了DOE的麻烦把数据发给我（snowli77@yahoo.com.cn)，我整理在一起后再放进论坛（好像现在论坛还不能直接帖文件， 我要管理员帖上来）。

我起个引子：

1.Fixture and probe
   -It is easy to be contaminated,the probe can be damaged easily

2.Time control
   -It is easy to be oxidated,so the time control is much more critical.

3.The times of re-test
   -Be tested much more times until pass due to the remain flux so much

4.Judge the result incorrectly
   -It is easy to get false reject

5.test coverage

   -It is hard to test all the devices on the board correctly during OSP finishs.

好帖！！