标题: Agilent3070资料库--想要的就进来! [打印本页]

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作者: tony0716    时间: 2004-3-24 11:05

Agilent3070 training manual * Control card control’s relay closures and ASRU’s measurement. ATL --- analog test language MOA --- measurement operational amplifier Rx is the device under test on the PC board. A voltage, Vs, is applied through the S (source) bus to one lead of Rx and the other lead is connected to the I (input) bus of the MOA. Rref is a precision feedback resistor. The output voltage of the MOA, Vmoa, is measured by an internal voltmeter. All the pieces of the measurement (Vs, Rref, the MOA, and the DVM) are located on the ASRU card. Rx = -(Vs/Vmoa) * Rref --- Resistive component tests Relay connections and test commands; Relay Commands Disconnect all opens relay connections on all busses. Connect to “” connects specified bus to specified node on the PC board Test commands Component ,<+tol>,<-tol>, Where component is: resistor, potentiometer, inductor or capacitor --- Testing jumpers, fuses & switches Note: there are no tolerances in the test commands line. These tests are threshold tests. Commands: Disconnect all Connect s to “J1-1” Connect I to “J1-2” Jumper 9K, re3, wb, ar100m, op Op— the “open” or “opposite” option is used when the expected result will be an open rather than a short. If op is used, then a measurement above the threshold is considered a passing measurement If the op option is omitted, then the passing measurement is one below the threshold. Remember: Use no option to test normally closed switches, jumpers, and fuses and the “op” option for normally open switches, jumpers, and fuses. The “wb” or wideband option increase the MOA’s gain. --- Reactive component tests Commands: Disconnect all Connect s to “Zx-1” Connect I to “Zx-2” Inductor 10.0n, 11.0, 10.5, re4, ico1, fr1024 Reactive components (inductor and capacitors) require a slightly different test technique. Obviously, an AC source and detector are required. To accommodate these new considerations, the HP3070 software adds some new option to the test command for inductor and capacitors. Some new test options Ico0, ico1: current compliance of the source. X is a flag that is set to 0 for a source compliance of 35mA and 1 for a source compliance of 150mA. FrX: sets the frequency of the source in Hertz. X must have one of the following values: 128,1024,8192. Note that these frequencies cover roughly 3 decades and the 128 value requires and ed option (covered later). Pm,sm: the HP3070 assumes that reactive components have parasitic resistances and chooses either a parallel or series model. The default model for capacitors is “pm” (parallel model), for inductor it is “sm”(series model). ~~ Small value capacitor measurement Commands Sub characterize Learn capacitance on Test “analog/c1” Learn capacitance off Subend

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作者: tony0716    时间: 2004-3-24 11:26

有些资料很大,需要的请给我你的EMAIL
我发给你们...

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作者: wonderful    时间: 2004-3-24 11:35

非常感谢！

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作者: tony0716    时间: 2004-3-24 12:25

大家共同努力,才能把我们这个论坛建设成最好的论坛.
我想这是我们共同的目标...

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作者: tony0716    时间: 2004-3-25 08:57

已经给你发了一点,由于你的邮箱不够大,所以我还是分批给你吧.
望你见谅!

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作者: xlcyd    时间: 2004-3-25 11:55

大哥,俺也想要,给我好吗?Email:xlcyd@sohu.com
谢谢！

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作者: tony0716    时间: 2004-3-25 12:27

也给你发了.

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作者: tony0716    时间: 2004-3-25 19:03

OK, no problem

I will send the other reference document to you tomorrow.

thanks

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作者: zisen2004    时间: 2004-3-26 07:37

I am email is feidouglas555@eyou.com
thank you!!!!!!

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作者: tony0716    时间: 2004-3-26 08:53

请耐心等待,我会一一回复的.

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作者: snowli    时间: 2004-3-26 11:46

非常感谢Tony的热心，我将申请将你晋升为圣侠，以资鼓励

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作者: tony0716    时间: 2004-3-26 12:53

谢谢!!!

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作者: tony0716    时间: 2004-3-26 13:40

Analog In-Circuit Test

PerShorts: it is running analog tests to assure that adjustable devices are set in the correct positions before executing subsequent tests.

Analog test source files are written in Analog Test Language (ATL). Initially written by HP IPG, they consist of two sections.
1.        Close relays to connect the correct busses to the device under test.
2.        Perform the measurement with the specified options.

Remember:
1.        Test sources are located under the directory “analog”
2.        Each analog test has two sections – relay control statement and test commands.
3.        The object file is what the hardware uses to execute the test. if a source file is edited and re-saved, but not re-compiled, the original object is used. Therefore, always remember to re-save and re-compile a source when it is edited.


The heart of this measuring system is the Measurement Operational Amplifier (MOA).

Vs is applied through the S (source) bus to one lead of Rx.
Rref is a precision feedback resistor.
Vmoa is the output of the MOA. It is measured by an internal voltmeter.

All the pieces of the measurement are located on the ASRU card.

The two Fundamental Assumptions regarding Analog In-Circuit test
For the moment we assume the MOA to be ideal, thus its input impedance approaches infinity.
         

  

Remember:
This technique depends on the validity of two assumptions:
1.        The current, Irx equals the current, Iref
2.        These currents can be accurately measured.
Subsequent modules will deal with cases where these two assumptions cannot be guaranteed. You should always keep in mind the basic analog in-circuit equation.

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作者: tony0716    时间: 2004-3-26 13:40

Option list:
reX: Specifies the value of Rref, the feedback resistor. X ranges from 1-6.

arX: Specifies the range of the internal voltmeter. X ranges from 0 to 10 volts for DC measurement. The voltmeter will automatically up-range if set too low but it will not downrange. If the voltmeter does need to autorange, the  process can result in rather slow tests, as the voltmeter must make a measurement, detemine that the range is set too low, up-range one level and repeat the process.

amX: specifies the voltage of the DC source. X ranges from –10 to +10 volts for DC sources. If not included in the option list, the source is set to 100mV DC as a default.

Reactive component test options
ico0, ico1: 0 for a source compliance of 35mA, and 1 for a source compliance of 100mA.

frX: 128, 1024, 8192.

pm, sm: the default model for capacitors is “pm” (parallel model), for inductors, it is “sm” (series model).

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作者: tony0716    时间: 2004-3-26 13:41

HP Pushbutton Debug – Analog Test

The resistor’s measurement are noisy, the test is unstable.
Solution: if the test is unstable, use the ed option. Generate a new histogram to confirm the improved stability. You should see a 2x improvement in the stability.
        If this did not improve the stability of the test or did not improve it enough, remove the option and widen the test limits.
        Look for reactive components near the device under test. Guard any them if they might be causing inconsistent results.

The resistor’s measured value is greater than excepted value.
Solution: if the device is measured high, you are loosing current somewhere. It could be because the Zig is too small. Try reversing the S/I bus connections.
        Try adding remote sensing: A bus and B bus
        If you cannot get the measurement to be accurate, widen the test limits or comment the test.
        If the test is beyond the added 10%, comment the test and don’t test this device.

The resistor’s measured value is less than excepted value.
Solution: First, find the failing component and look at the circuitry around it. Is there a parallel path around the device? If you find, select a ground point and add it to the test. If the measurement was not improved, remove the change. Use the same remote sensing tools (sa, sb) as above to improve the test accuracy.
        There are two options that you might try using either in conjunction with the ground or if no ground point is found. These are the ed and wait options.

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作者: tony0716    时间: 2004-3-26 13:42

Overview of HP-UX

Path names
There are two kinds of pathnames: absolute and relative

cd /users/user4/class_bd
        change directory to /users/user4/class_bd
ls fixture
        list, short the relative directory fixture
ls /users/user4/class_bd/fixture
        list, short the absolute directory fixture
cd ..
        change directory to the parent directory
ls
        list, short the current directory
ls .
        list, short the current directory
pwd
        present work directory is given: /users/user4
ll
        print the long listing of the current or specified directory
lsf
        print the short list of the current or specified directory, but also include a flag on directories and executable files
who
        report the logon name of all users currently on the system
whoami
        tells you who you currently logon’ed on as
hostname
        displays the name of the computer you are currently on
cd /
etc/shutdown
rm –r         remove the file

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作者: tony0716    时间: 2004-3-26 13:44

上面这些都是比较基本的东东,希望能给那些新手一些帮助.

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作者: tony0716    时间: 2004-3-26 13:47

下面讲点B-scan.

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作者: tony0716    时间: 2004-3-26 13:50

[upload=bmp]uploadImages/2004326134741.bmp[/upload]

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作者: tony0716    时间: 2004-3-26 13:55

At the device level, the boundary-scan elements contribute nothing to the functionality of the internal logic. In fact, the boundary-scan path is independent of the function of the device. The value of the scan path is at the board level as shown in Figure 11.
The figure shows a board containing four boundary-scan devices. Notice that there is an edge-connector input called TDI connected to the TDI of the first device. TDO from the first device is permanently connected to TDI of the second device, and so on, creating a global scan path terminating at the edge connector output called TDO. TCK is connected in parallel to each device TCK input. TMS is connected in parallel to each device TMS input.

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作者: tony0716    时间: 2004-3-26 13:57

[upload=bmp]uploadImages/2004326135546.bmp[/upload]

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作者: tony0716    时间: 2004-3-26 13:58

What the tester sees from the edge connector is simply the concatenation of the various boundary-scan registers – that is, a single register that provides access to all device outputs now considered to be drivers (sometimes called a transmitter) onto an interconnect and all device inputs now considered to be sensors (sometimes called a receiver) from the interconnect – see Figure 12.
In this way, particular tests can be applied across the device interconnects via the global scan path by loading the stimulus values into the appropriate device-output scan cells via the edge connector TDI (shift-in operation), applying the stimulus across the interconnects (update operation), capturing the responses at device-input scan cells (capture operation), and shifting the response values out to the edge connector TDO (shift-out operation).
Essentially, boundary-scan cells can be thought of as virtual nails, having an ability to set up and apply tests across the interconnect structures on the board.

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作者: tony0716    时间: 2004-3-26 14:00

[upload=bmp]uploadImages/2004326135910.bmp[/upload]

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作者: tony0716    时间: 2004-3-26 14:02

Figure 13 shows a basic universal boundary-scan cell, known as a BC_1. The cell has four modes of operation: normal, update, capture, and serial shift. The memory elements are two D-type flip-flops with front-end and back-end multiplexing of data. (As with all circuits in this tutorial, it is important to note that the circuit shown in Figure 13 is only an example of how the requirement defined in the Standard could be realized. The IEEE 1149.1 Standard does not mandate the design of the circuit, only its functional specification.)
During normal mode, Data_In is passed straight through to Data_Out.
During update mode, the content of the Update Hold cell is passed through to Data_Out.
During capture mode, the Data_In signal is routed to the input Capture Scan cell and the value is captured by the next ClockDR. ClockDR is a derivative of TCK.
During shift mode, the Scan_Out of one Capture Scan cell is passed to the Scan_In of the next Capture Scan cell via a hard-wired path.
Note that both capture and shift operations do not interfere with the normal passing of data from the parallel-in terminal to the parallel-out terminal. This allows on the fly capture of operational values and the shifting out of these values for inspection without interference. This application of the boundary-scan register has tremendous potential for real-time monitoring of the operational status of a system — a sort of electronic camera taking snapshots — and is one reason why TCK is kept separate from any system clocks.

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作者: tony0716    时间: 2004-3-26 14:05

[upload=bmp]uploadImages/2004326140345.bmp[/upload]

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作者: tony0716    时间: 2004-3-26 14:06

The Figure shows the following elements:
  A set of four dedicated test pins — Test Data In (TDI), Test Mode Select (TMS), Test Clock (TCK), Test Data Out (TDO) — and one optional test pin Test Reset (TRST*). These pins are collectively referred to as the Test Access Port (TAP).
  A boundary-scan cell on each device primary input and primary output pin, connected internally to form a serial boundary-scan register (Boundary Scan).
  A finite-state machine TAP controller with inputs TCK, TMS, and TRST*.
  An n-bit (n >= 2) Instruction register, holding the current instruction.
  A 1-bit Bypass register (Bypass).
  An optional 32-bit Identification register capable of being loaded with a permanent device identification code.

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作者: tony0716    时间: 2004-3-26 14:17

一口气发了很多资料,累了.
下次在发,先让大家消化一下吧,哈哈......

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作者: tony0716    时间: 2004-3-26 16:40

大家一起来参与啊,有资料的朋友请不要吝惜嘛...

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作者: tony0716    时间: 2004-3-26 16:46     标题: [注意] 谢谢snowli的支持,看来今后要更加努力地为我们这个论坛服务了,呵呵.........

[em26][em26][em26][em26][em26]

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作者: wujinhua    时间: 2004-3-26 21:36

有给我发一个
E-mail:wujonhua@yahoo.com.cn

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作者: flying    时间: 2004-3-26 23:12

高手,可以发给小弟一份吗! 感谢了!!

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作者: rojun123    时间: 2004-3-28 11:40

呵呵，我是也需要这些资料，谢谢你帮我也传一份。rojun@163.com

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作者: eagle9135    时间: 2004-3-28 22:06     标题: [求助]

发一点给我吧能否给我一点硬件方面的资料。可以发到我的eagle9135@sina.com.cn  谢谢。

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作者: wang00570657    时间: 2004-3-29 08:58

tony716,你有没有关于3070操作指导方面的资料？

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作者: tony0716    时间: 2004-3-29 09:10

楼上所有的朋友,请你们注意查收各自的邮箱,我已经将资料发给你们.

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作者: wang00570657    时间: 2004-3-29 09:28

我没有收到啊！！

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作者: tony0716    时间: 2004-3-29 10:03

好像是有几封被拒发了,请再换个地址吧

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作者: wang00570657    时间: 2004-3-29 10:13

我e-mail guanjie.wang@pemstar.com
你发过来试试，一封不能超过2M

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作者: yiping1128    时间: 2004-3-29 11:10

请问可以发给我吗？我还没有说明：wangxia1128@126.com

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作者: tony0716    时间: 2004-3-29 11:32

重新给你们发了一遍了.  注意了,兄弟们...

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作者: wang00570657    时间: 2004-3-29 11:37

555，还是不行啊，tony716,你发的附件多大？什么格式的？

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作者: tony0716    时间: 2004-3-29 12:21

不大啊,2M不到.应该可以的啊

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作者: tony0716    时间: 2004-3-29 12:24

请再报一遍你的EMAIL地址,我再发!

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作者: maigeko    时间: 2004-4-7 19:35     标题: [求助]

楼上的大哥,我也是初学者,能帮我发一些资料吗,感激不尽,
我的邮箱是qsmc520@yahoo.com.cn[em23][em23]

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作者: longz8    时间: 2004-4-9 12:10

哈哈，我也是初学者，希望能收到一些资料，十分感激！
我的邮箱是：passenger_jam@163.com

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作者: 790805    时间: 2004-4-11 22:33

大侠我也想要. E_mail : xiaodong_yang@jabil.com
需要debug方面的资料.
谢谢!

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作者: 790805    时间: 2004-4-11 23:39

我想要一些hp3070的资料,能具体讲以下软硬件.
testhead
support bay
host
testplan
pushbutton debug
test method : pins ,preshorts, shorts, analog, unpower ,analog powered
                       testjet, seting up powered,digital in circuit ,mixed,etc.
vacuum
air
hp6624
GPIB
PIN Card,ASRU Card,control Card,mother Card,system Card
Ext power system
Unix OS
若有请sent E_mail给我: xiaodong_yang@jabil.com
谢谢!

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作者: Tony0716    时间: 2004-4-20 09:37

hi, friend.

i am from Jabil Shanghai. Are you from Jabil PangYu?

Last year, our plant send a set of HP3070 to your side, do you know?

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作者: Tony0716    时间: 2004-4-23 08:50

你可以与我联系.

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作者: yalikelly    时间: 2004-4-24 14:13

高手，可以也給我發一份嗎？小弟先在這裡謝了  yalikelly@yahoo.com.cn

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作者: zhang||sword    时间: 2004-4-25 10:36

我也要。请发我一份。先谢谢了
我的EMAIL：zhanglq304@sohu.com

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作者: Tony0716    时间: 2004-4-26 17:11

东西太多,可不可以说的具体一点.
我分开来寄给你们

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作者: wonderful    时间: 2004-4-27 16:26

我都想要,呵呵

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作者: wonderful    时间: 2004-4-27 16:39

问一下Tony0716和Tony716是一个人吗?

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作者: dengyilong    时间: 2004-4-27 23:38

可以发给我吗
dengyilong@163.com

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作者: Tony0716    时间: 2004-4-28 17:40

对，是一个人。
由于版主把我原先的帐号删除了，所以我重新注册了一个新的帐号。

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作者: wonderful    时间: 2004-4-30 11:02

呵呵,这样啊.明白了.是不是你做什么坏事情被删的啊.哈哈.玩笑话~~别介意

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作者: Tony0716    时间: 2004-4-30 12:46

不是,根据他们的解释,说是要提拔我,所以要更新我的资料. 但我不知道为什么要把我的帐号删除???
我也通知他们了,可现在没有人回复我了...

疑惑中.....................................

看来版主们都相当忙,没时间理会我们了~~~

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作者: wonderful    时间: 2004-4-30 14:16

^_^，还有这样的事情，真是少见，那只好等他们答复了，最近版主们都好像没来论坛了不知道在忙什么呢

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作者: Tony0716    时间: 2004-4-30 18:23

是啊！
我就是在等他们的回复啊
不知道他们如何回答我的。

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作者: zgyqhy    时间: 2004-5-3 17:09

大哥，给我发一下，谢谢。 zgyeg@hotmail.com

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作者: 017061    时间: 2004-5-4 13:42

My email : andy.tu@mic.com.tw

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作者: Tony0716    时间: 2004-5-5 18:22

需要什么类型的资料？
硬件的还是软件的？

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作者: leopold    时间: 2004-5-6 01:52

我要1580273@QQ.com...谢谢您

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作者: 017061    时间: 2004-5-6 14:54

拜托,发我一份吧 . tuhui835@163.com

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作者: Tony0716    时间: 2004-5-6 18:26

我说过了啊，请你们说的具体一点。因为内容实在太多了，资料很多。

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作者: Tony0716    时间: 2004-5-10 18:40

我的帐户终于恢复了，呵呵！

谢谢斑竹的帮忙！！！

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作者: 320921198003113    时间: 2004-5-17 17:02

Tony0716你好！我是刚毕业的学生！我现在所找的第一份工作就是搞agilent3070的，由于是新手，公司现在没有培训的机会。肯请你能帮我。我的email是blackboy273@hotmail.com.多谢大侠！

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作者: Tony0716    时间: 2004-5-18 12:56

320921198003113812,
已经给你发了点东西了,希望有用.其他资料实在太大,没办法.SORRY

谢谢!

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作者: 320921198003113    时间: 2004-5-18 19:52     标题: 3070

谢谢你tony0716,我有关于agilent3070的user document 光盘，请问看这个对我提高技能帮助大吗？l

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作者: Tony0716    时间: 2004-5-18 20:10

yes, of cause!

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作者: 017061    时间: 2004-5-21 13:48

能发给我一些吗，　tuhui835@163.com

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作者: Tony0716    时间: 2004-5-21 15:27

今后要HP3070的资料请到:软件开发版来找我.

谢谢!!!

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作者: Tony0716    时间: 2004-5-21 15:32     标题: 关于HP3070的资料,请到"软件开发与实际应用"版找我!

谢谢!

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作者: 320921198003113    时间: 2004-5-21 17:03

tony0716你好请问3070在测试bist时总是误测，我问我们老大是否有办法解决这种现象！他说只能等死了！是这样吗？谢谢！

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作者: 320921198003113    时间: 2004-5-21 17:04

tony0716你好请问3070在测试bist时总是误测，我问我们老大是否有办法解决这种现象！他说只能等死了！是这样吗？谢谢！

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作者: aren_li    时间: 2004-5-23 05:13

各們大俠,有資料也別忘發給我一份. 多謝,我e-mail: 19811023lxy@163.com

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作者: Tony0716    时间: 2004-5-23 11:51

可否说的具体点？

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作者: proof1106    时间: 2004-5-23 14:57

大哥,能给我些资料吗?我刚刚转行,在学习ICT,但是现在什么都不懂.
我的E-mail:Steven_Pu@jhtsz.com.cn
在此先谢过了.

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作者: aren_li    时间: 2004-5-26 01:52

tony0716,有沒有關于digital 的debug 方面的資料發點給我啊,謝啦
我e-mail:19811023lxy@163.com

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作者: 水手12345    时间: 2004-5-26 12:29

前辈,能否给我一份.

Email: hunter.qiu@cn.flextronics.com

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作者: Tony0716    时间: 2004-5-26 15:25

请到"软件开发与实际应用"--HP-UX讨论专区,里面有关于Digital Test的介绍

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作者: jackyfoo    时间: 2004-5-27 22:29

那个。。。。aligent3070是什么东西啊？？
汗。。。

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作者: Binyang    时间: 2004-5-31 01:17

我先要关于program部分的，谢谢！
===================================
api1976@21cn.com

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作者: neillian@21cn.c    时间: 2004-6-2 15:59

我也要
liangzileaf@vip.sina.com
谢谢！

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作者: tuhui835    时间: 2004-6-5 14:11

tuhui835@163.com 或者 andy.tu@mic.com.tw

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作者: alpha520    时间: 2004-6-8 14:39

可以给我一份吗？win_fly@163.com

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作者: alpha520    时间: 2004-6-8 14:45

我想要一些关于操作方面的资料，请问谁有吗？

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作者: 7724335    时间: 2004-6-22 17:18

師兄﹐給我這方面資料﹐我也希望學習一下。EMAIL:7734109@SOHU.COM

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作者: kikozhong    时间: 2004-6-22 21:41

大侠,俺想要,给我好吗?Email: kikozhong@126.com

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作者: kikozhong    时间: 2004-6-22 22:16

各位朋友
我下载不到HP3070的资料,那位可以E-MAIL(YAN2025@163.COM)给我一下.软\硬都要

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作者: kikozhong    时间: 2004-6-22 22:17

谁有程式编写方面的资料能ＭＡＩＬ一份给我吗？

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作者: tuhui835    时间: 2004-6-25 09:38

资料上传啊,不用MAIL来MAIL去的,我们都是搞测试的资料共享一下嘛.

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作者: zhoufurong    时间: 2004-6-26 20:55

好哥哥！有没有讲关于debug board资料呀　
zhoufurong1982@yahoo.com.cn

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作者: mickeyzhou    时间: 2004-7-11 20:49

这位大哥，给我发一个好吗，谢谢啦
mickeyzhou@126.com

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作者: freespace    时间: 2004-7-11 21:14

可以给我发一份吗？E-MAIL：jqm@shinco.com

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作者: Tony0716    时间: 2004-7-12 08:44

我现在在"软件开发与实际应用"版,如你需要帮助,请到该版来找我,谢谢!

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作者: tuhui835    时间: 2004-7-12 20:43

没有资料啊

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作者: Tony0716    时间: 2004-7-13 15:22

已经更新,可以到FTP SERVER查找

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作者: tuhui835    时间: 2004-7-13 17:32

好的谢谢

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