希望大家能积极参加这个讨论，如果有做了DOE的麻烦把数据发给我（snowli77@yahoo.com.cn)，我整理在一起后再放进论坛（好像现在论坛还不能直接帖文件， 我要管理员帖上来）。 我起个引子： 1.Fixture and probe
-It is easy to be contaminated,the probe can be damaged easily 2.Time control
-It is easy to be oxidated,so the time control is much more critical. 3.The times of re-test
-Be tested much more times until pass due to the remain flux so much 4.Judge the result incorrectly
-It is easy to get false reject 5.test coverage -It is hard to test all the devices on the board correctly during OSP finishs. [em01][em08] | 
